Tuesday 21.3.23Sammy Ofer StadiumRutenberg 2 St .Haifa, Israel
Register and save your seat
08:00 – 08:45
08:45 – 09:20
Multifunctional System for Academy R&D and Mass Production
By: Brian Stickney Customer Service Manage
09:20 – 10:00
Non-Destructive Coating Characterization, Accurate and Fast material analysis
By: Ioannis Raptis Thetametrisis COO
10:15 – 11:15
Metrology, inspection, process control and Lithography overview outlook and where are we heading
By: Izak (Kapi) Kapilevich Application & System Engineering Expert
11:15 – 12:00
Thermal Warpage Effects in Surface Mount Technology Recent Trends and Studies
By: Neil Hubble President Akrometrix
12:00 – 13:15
13:15 – 14:00
Wafer and substrate handling solutions H-Square Corporation
By: Len Angle H-Square Corporation
14:00 – 14:45
Introduction to cathodoluminescence: a non-destructive method for compound semiconductor research and process development
By: Samuel Sonderegger PhD / CEO Attolight
15:00 – 15:45
EFA and PFA Playing a More Critical Role With the Increase in Process/Device complexity