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Minimum quantity should 500 of "TFA for TEM lamella sample lift out in FIB"
KN Series for Kleindiek System
PS8140mm width platform with 8tip holders that is compatible in 6” load lock • Failure analysis
• Qualifying high gate materials
• Low current transistor testing
• Four point probing
• EBIC, EBAC, RCI, EBIV, EBIRCH, and Active Potential Contrast analysis
• Current Imaging
• Characterization of advanced materials and structures e.g. nanowires, ultra thin films
• Nanoscale assembly and manipulation Contact Us for Further Information
SKU:
bf8e05d24615
Category: Mesoscope
Additional information
Data Sheet